E ects of stirring on the bulk etch rate of CR-39 detector
نویسندگان
چکیده
It is well established that the bulk etch rates for solid state nuclear track detectors are a ected by the concentration and the temperature of the etchant. Recently, we found that the bulk etch rate for the LR 115 detector to be a ected by stirring during etching. In the present work, the e ects of stirring on the bulk etch rate of the CR-39 detector is investigated. One set of sample was etched under continuous stirring by a magnetic stirrer at 70◦C in a 6:25 N NaOH solution, while the other set of samples was etched without the magnetic stirrer. After etching, the bulk etch thickness was measured using Form Talysurf PGI (Taylor Hobson, Leicester, England). It was found that magnetic stirring did not a ect the bulk etch of the CR-39 detector, which was in contrast to the results for the LR 115 detector. c © 2003 Elsevier Ltd. All rights reserved.
منابع مشابه
E ects of stirring on the bulk etch rate of LR 115 detector
The e ects of stirring on the bulk etch rate of LR 115 detector has been investigated. The surface pro6le measurement method using an instrument called Form Talysurf has been used to measure the thickness of the active layer of the LR 115 detectors. The etchant was 10% aqueous solution of NaOH maintained at 60◦C. The bulk etch rate under magnetic stirring has been found to be 6:65 ± 0:34 m h−1 ...
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